It seems you're referring to a specific document related to semiconductor testing, particularly focusing on the JEDEC (Joint Electron Devices Engineering Council) standard. The JEDEC standards are critical in the electronics industry for ensuring the reliability and compatibility of semiconductor devices.
Auto-Refresh and Self-Refresh Modes: The standard includes specifications for auto-refresh and self-refresh modes, which are critical for maintaining data integrity without the need for external intervention. jesd79-4d pdf
Key architectural note: tCCD_L vs tCCD_S exploits bank groups. Bursting reads across different bank groups yields higher bandwidth. It seems you're referring to a specific document
standard, published in July 2021, defines the comprehensive specification for DDR4 SDRAM Extract and summarize specific sections (e
| Revision | Key Additions | | :--- | :--- | | JESD79-4 | Initial release of DDR4 standard. | | JESD79-4A | Added data rates up to 3200 MT/s, clarified ODT timing. | | JESD79-4B | Introduced new mode registers for improved training, PCR (Post CAS Readability). | | JESD79-4C | Critical fixes for tRFC parameters, added 16Gb density support. | | JESD79-4D | Final major revision before DDR5 dominance. Includes all previous fixes plus finalized power-saving features, Vref training refinements, and errata corrections for bank group timing. |