Advantest 93k Tester Manual Access

Advantest V93000 (93k) tester series features a modular, scalable architecture designed for high-performance SoC (System-on-Chip) and memory testing. Key features documented in its manuals and system references include: Hardware Architecture & Performance Tester-per-Pin Architecture:

: Documentation RPMs and packages for various SmarTest versions (e.g., SmarTest 7, SmarTest 8) can be downloaded from the myAdvantest portal with a valid service agreement. ADVANTEST CORPORATION Core Documentation Categories advantest 93k tester manual

Do not skim it. Study its diagrams. Memorize the trouble codes. And always keep a copy on the workstation desktop. Advantest V93000 (93k) tester series features a modular,

1. Know Your Manual Set (Yes, There Are Several)

The 93K documentation is split into key volumes. Keep these PDFs handy: Grab Maintenance Manual → Chapter: “Error Messages and

2.2 Pin Electronics (PE) Cards

The 93K distinguishes itself through its granular card architecture. Cards are organized by function:

1. Grab Maintenance Manual → Chapter: “Error Messages and Troubleshooting”.
2. Look up “Thermal Trip” – it lists three root causes: a) Airflow obstruction, b) Failed fan module, c) Overloaded power supply zone.
3. Navigate to “Preventative Maintenance” section to locate the air filter part number and fan module LED status codes.
4. Identify that an orange LED on fan tray 2 indicates a stalled fan.

You must have a service agreement to download documentation packages from the Advantest Software Center Self-Service Portal: Most users access these documents by logging into the myAdvantest portal and requesting software center access. ADVANTEST CORPORATION Core Documentation Categories

• Example: If you see error -201: "Invalid character in data field" in SmarTest – search the Programming Reference for -201, not the Hardware manual.
• Example: If your DPS32 card shows overcurrent – search the System Hardware Reference for DPS32 overcurrent.

DUT Board Design: Specific guidelines for designing loadboards and wafer test interfaces. 2. System Hardware and Architecture